Technical documents list

• High-performance Surface Plasmon Resonance instrument (SPR)
  - Intermolecular Interaction Analysis （SPR, ITC）
  - We introduced the latest SPR instrument, Sierra SPR-24!!
• TPD-TOFMS
  - Online Accurate mass measurements of evolved gas～TPD-TOFMS analysis～
  - On-line measurement of heat-generated gas by TPD-TOFMS Application to functional groups reaction analysis etc
• GCIB-TOF-SIMS, TOF-SIMS
  - Structural analysis of OLED components by TOF-SIMS MS/MS
  - TOF-SIMS MS/MS for analysis of degradation product in OLED driving test
  - Degradation analysis of OLED -Influence of trace level water in accelerated test-
  - Depth profile analysis of SEI on anode by GCIB-TOF-SIMS
• fs LA-ICP-MS
  - Quantitative Imaging of Trace Elements in Mouse Spinal Cord using fsLA-ICP-MS
• NanoSIMS 50L
  - Penetration evaluation of the chemical agent to the hair using NanoSIMS
  - Distribution of Impurities in semi-conductor device by NanoSIMS
  - Imaging and Depth Profiling of SiC-MOSFET by NanoSIMS 50L
  - Surface imaging of bio-samples using immunostaining-NanoSIMS
  - NanoSIMS Analysis of 3D NAND Flash Memory
  - Imaging of cross section of the skin using NanoSIMS
  - NanoSIMS elemental analysis for cross-section of SiC-MOSFET
  - NanoSIMS Analysis of Automotive Coatings
  - NanoSIMS Analysis of Metal Material
  - 2D dopant image in cross-section of glass fiber by NanoSIMS
  - Coverage evaluation of active material by NanoSIMS
• AFM-Raman
  - Nanoscale Raman analysis of carbon materials using AFM-Raman microscopy
  - Latest IR spectroscopy with sub-micron spatial resolution
• ASTAR-STEM
  - Crystal orientation map and grain size analysis using ASTAR with nm resolution
  - Characterization of grain diameter and crystal orientation in the MEMS devise using ASTAR
  - Strain Analysis at nano-meter region using ASTAR
• O-PTIR
  - Latest IR spectroscopy with sub-micron spatial resolution